Double Degree in Electronic Systems Engineering in Communications and Management of ICTS La Salle Campus Barcelona

Double Degree in Electronic Systems Engineering in Communications + in Engineering in the Management of ICTs

La Salle Campus Barcelona offers 5 double degrees in the ICT Engineering field. With the double degrees, you can finish the university studies in 5 academic years with two official degree qualifications.

Peripheral Equipments

The subject gives an overview of the input / output subsystem (I / O) of a computer and the most important devices that compose it. The first chapters are devoted to studying the functions of this block, the communication with the rest of the computer blocks (CPU and memory) as well as the different synchronization and data transfer techniques. The most important parameters used to measure system performance are also introduced and analytical techniques are developed focusing on selecting the architectures and techniques enabling the optimal system-level performance. The following topics are devoted to the study of the architecture of the most important computer I/O subsystems, mainly visualization and data storage systems, as well as some common interfaces used in these systems. The final part introduces the I/O bus concept (including a detailed study of the USB bus) and studies the architectures and technologies used in the most common peripheral devices (keyboard, mouse, printers, etc.).
Type Subject
Tercer - Obligatoria

Titular Professors

Previous Knowledge

Basic skills on logic design and on high-level programming languages (C)


RA.1 Obtain an overview of the Computer I / O subsystem and the functionality delivered by this block.
RA.2 Ability to analyze the critical parameters of the system (cost, performance, etc.) and the relationship between them.
RA.3 Ability to devise and evaluate different I/O subsystem architectural options: alternatives, impact of design decisions, optimal configurations.
RA.4 Design of systems that include I/O functionalities.
RA.5 Basic knowledge about the architectures and technologies used in visualization and data storage devices.
RA.6 High-level design (block diagram) of peripheral devices (printer, hard disk drive).
RA.7 Knowledge of the technologies used in peripheral devices: availability, evolution, etc.
RA.8 Ability to create drivers to handle interruptions, DMA transfers and display devices.




The subject is taught through master classes in which visual material (PowerPoint presentations) is used for the presentation of the theoretical contents. The structure and content of the material are designed, not just for class teaching usage, but also to facilitate further study of the subject and reinforcement of key concepts by the student.

The consolidation of the theoretical content and its application in real environments is achieved through a set of practices that students must implement on a development platform for devices with ARM architecture.

Additionally, the students have a collection of problems solved and commented for each one of the subjects taught. Both the material used in class and the problem collections are available on the Moodle platform (eStudy).


The overall course grade will be determined as a weighted average of the scoring of the theoretical part and that of the practical part (Labs).

1. Scoring of the theoretical part
1.a. Ordinary examination
The assessment of the theoretical part is based upon the scores of the midterm exam (NPC) and the final exam (NEF).
Depending on the score of the midterm exam (NPC) the topics assessed in the final exam will be different:
• The topics not assessed in the midterm exam (i.e. the topics taught after the midterm exam) provided the scoring of the midterm is equal to or greater than 4 (NPC ≥ 4).
o In order to pass the subject, the final exam score, NEF, must be equal or greater than 4 (NEF ≥ 4).
o The final score of the theoretical part of the subject is calculated as: NT = 0.4 x NPC + 0.6 x NEF
o If NEF < 4 the theoretical part grade is a no-pass even if the averaged score calculated using the previous formulae is greater than 5.
• The entire list of course topics if NPC < 4 (or if the student aims at improving the score achieved in the midterm exam).
o In this case, the final score of theoretical part of the subject is calculated as: NT = NEF
1.b. Extraordinary examination
• The assessment of the theoretical part is based upon the score of the extraordinary exam (NCE).
o The final score of theoretical part of the subject is calculated as: NT = NCE

2. Scoring of the practical parts (Labs)
The scoring of the practical part (Labs) is calculated as the average of the scores of each individual Lab.
• Labs delivered before the due date will be scored on a scale of 10.
• Late submissions score is obtained as the Lab grading (on a scale of 10) times a correction coefficient equal to 0.8.
In order to achieve a pass, the scores achieved by the student must meet the following criteria:
• NT &#8805; 4, and
• NPR &#8805; 4, and
• Subject grade, NF = 0.6 x NT + 0.4 x NPR &#8805; 5

Evaluation Criteria

Failure to deliver the practical part entails a final grade of NP.

As a general rule, scores (neither that of the theoretical part nor that of Labs) are carried over to the next academic year.

All the assessment activities used for course grading (midterm, final exams, Labs) are considered “highly significant evaluation activities”.

Basic Bibliography

D. A. Patterson and J. L. Hennessy, Computer Architecture: A Quantitative Approach, 1st ed. San Mateo, CA: Morgan Kaufmann, 1990.
J. L. Hennessy and D. A. Patterson, Computer Architecture: A Quantitative Approach, 5th ed. Waltham, MA: Elsevier, 2011.
D. A. Patterson and J. L. Hennessy, Organización y diseño de computadores, la interfaz hardware/software. Madrid: McGraw Hill, 1995
J. C. Mallinson, The Foundations of Magnetic Recording, 2nd ed. Academic Press, 1993

Additional Material